Measuring and testing – Vibration – By mechanical waves
Patent
1993-09-28
1998-03-03
Williams, Hezron E.
Measuring and testing
Vibration
By mechanical waves
73602, 73615, G01N 2918
Patent
active
057237913
ABSTRACT:
A gauge for determining a thickness of a coating on a substrate includes a transducer for emitting ultrasonic signals into the coating and for generating electrical signals proportional to the ultrasonic signals received by the transducer, the received signals include first signals reflected from a transducer/coating interface and second signals reflected from a coating/substrate interface; a pulser for sending pulses to the transducer to trigger the emission of the ultrasonic signals; a sampler for sampling the electrical transducer signals and generating sampled data; a timer for controlling the pulser and the sampler so as to perform an equivalent time sampling of the signals received by the sampler; and a controller for calculating a thickness of the coating based on the sampled data, the controller includes the ability to subject the sampled data to a deconvolution analysis so as to distinguish sampled data corresponding to the first signals from sampled data corresponding to the second signals when the coating is thinner than a wavelength of the ultrasonic signal emitted by the transducer.
REFERENCES:
patent: H1084 (1992-08-01), Bylenok et al.
patent: 3427866 (1969-02-01), Weighart
patent: 3665754 (1972-05-01), Krautkramer et al.
patent: 3690154 (1972-09-01), Wells et al.
patent: 3724262 (1973-04-01), Niklas
patent: 3746121 (1973-07-01), Niklas
patent: 3774444 (1973-11-01), Kent
patent: 3901071 (1975-08-01), Hansen
patent: 3968680 (1976-07-01), Vopilkin et al.
patent: 4056970 (1977-11-01), Sollish
patent: 4070917 (1978-01-01), Niklas et al.
patent: 4117732 (1978-10-01), Brazhnikov
patent: 4173897 (1979-11-01), Forstermann et al.
patent: 4196607 (1980-04-01), Youtsey et al.
patent: 4221132 (1980-09-01), Poole
patent: 4261367 (1981-04-01), Freese
patent: 4364273 (1982-12-01), Redding
patent: 4438404 (1984-03-01), Philipp
patent: 4492118 (1985-01-01), Bathmann et al.
patent: 4570486 (1986-02-01), Volkmann
patent: 4643235 (1987-02-01), Schmoede et al.
patent: 4654584 (1987-03-01), Gyles
patent: 4658648 (1987-04-01), Roddeck et al.
patent: 4669310 (1987-06-01), Lester
patent: 4685075 (1987-08-01), Morita et al.
patent: 4715008 (1987-12-01), Jones
patent: 4764945 (1988-08-01), Tadahiro
patent: 4817615 (1989-04-01), Fukukita et al.
patent: 4818930 (1989-04-01), Flemming et al.
patent: 4821574 (1989-04-01), Takamizawa
patent: 4823590 (1989-04-01), Kniest et al.
patent: 4823801 (1989-04-01), Sakane
patent: 4838086 (1989-06-01), Bender et al.
patent: 4840066 (1989-06-01), Botsco et al.
patent: 4878114 (1989-10-01), Huynh et al.
patent: 4899589 (1990-02-01), Thompson et al.
patent: 4904954 (1990-02-01), Otake et al.
patent: 4930511 (1990-06-01), Rossman et al.
patent: 4955225 (1990-09-01), Kniest et al.
patent: 4971061 (1990-11-01), Kageyama et al.
patent: 4984567 (1991-01-01), Kageyama et al.
patent: 5021666 (1991-06-01), Reber
patent: 5038615 (1991-08-01), Trulson et al.
patent: 5092176 (1992-03-01), Buttram et al.
patent: 5113358 (1992-05-01), Reber
patent: 5150714 (1992-09-01), Green
patent: 5184516 (1993-02-01), Blazic et al.
patent: 5305239 (1994-04-01), Kinra
PosiTector 6000 Series brochure and instruction manual, 1992.
C-Scan, SPUD Signal Processing for Ultrasonic Detection brochure, 1990.
C-Scan, Digital Ultrasonic Inspection System brochure.
Panametrics, Inc., Ultrasonic Thickness Gages And Their Applications brochure.
StressTel Ultrasonic Testing Equipment, TM1D Operation Manual.
StressTel Ultrasonic Testing Equipment, T-Mike EZ Operation Manual, 1990.
"The Application Of Digital Signal Processing And Pattern Recognition To Ultrasonic And Electromagnetic Nondestructive Testing And Evaluation", Singh et al, Feb. 1991.
"Signal Processing And Data Aquisition Techniques For The Ultrasonic Nondestructive Evaluation Of Aerospace Materials", McRae et al, Canadian Aeronautics And Space Journal, vol. 38, No. 1, Mar. 1992.
"Principles And Method Of Ultrasonic Characterization Of Materials", Mahesh Bhardwaj, Advanced Ceramic Materials, vol. 1, No. 4, 1986.
"Ultrasonic Measurement Of Paint And Organic Coatings On Plastics And Composites", John Brunk, 1987.
"Thickness Of Paint On Plastic And Composites", No. 19, Rev. '90/A.
"Ultrasonic Measurement Of Thickness Of Paint On Plastic", Thomas Nelligan, Materials Evaluation, vol. 48, Jul. 1990.
"Digital Signal Processing Techniques For Improved Temporal Resolution Of Ultrasonic Signals", S.M. Kramer, Jul. 17, 1987.
Analog Devices 125 MSPS Monolithic Sampling Amplifier brochure.
Beamish David J.
Koch Frank J.
Vandervalk Leon C.
Ashraf Nashmiya
DeFelsko Corporation
Williams Hezron E.
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