High resolution three dimensional topography using a flatbed...

Details High resolution three dimensional topography using a flatbed... High resolution three dimensional topography using a flatbed...

2008-06-10

2010-10-05

Nguyen, Tu T (Department: 2886)

Optics: measuring and testing

Shape or surface configuration

Reexamination Certificate

active

07808654

ABSTRACT:
An optical measuring apparatus for measuring 3D surface profiles of an object comprising, in combination: a linear detector array; an imaging system including a light source to image the object onto the detector array; and machine readable software for producing a 3D topology map from a 2D image, wherein the apparatus is calibrated by changing the optical focus distance between the detector array and the object for the purpose of 3D measurement calibration, and changing the relative lateral positions between the detector array and the object for the purpose of scanning the object's surface.

REFERENCES:
patent: 2006/0228010 (2006-10-01), Rubbert et al.
patent: 2007/0296979 (2007-12-01), Morimoto et al.

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