High-resolution spectroscopy system

Details High-resolution spectroscopy system High-resolution spectroscopy system

1992-03-30

1994-04-19

Turner, Samuel A.

Optics: measuring and testing

By particle light scattering

With photocell detection

356352, G01B 902

Patent

active

053050770

ABSTRACT:
The radiation to be analyzed is sent onto an interference filter which selects different portions of the radiation spectrum in correspondence with different incidence angles. The intensity values of the radiation outgoing from the element are stored by a measuring and data processing unit which processes such values with the transfer function of the element to obtain the information on the spectrum.

REFERENCES:
patent: 4008961 (1977-02-01), Barrett et al.
patent: 5059026 (1991-10-01), Zoechbauer
The Accuracy of Laser Wavelength Meters, R. Castell et al. 2318B Applied Physics B. Photophysics, No. 1, Berlin, Germany.
Applied Optics, vol. 25, No. 24, Dec. 15, 1986, p. 4520 Jennings et al.
8127 Review of Scientific Instruments, No. 9, Woodbury, N.Y. Sep. 1985.

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