Optics: measuring and testing – For optical fiber or waveguide inspection
Patent
1997-11-04
1999-12-14
Evans, F. L.
Optics: measuring and testing
For optical fiber or waveguide inspection
356301, 356318, 356376, 2504581, G01N 2164, G01N 2165, G01B 1124
Patent
active
060024712
ABSTRACT:
A method of obtaining high-resolution spectroscopic information from a scanning microscope. An optical beam is directed at a sample and light emitted from the sample (e.g., from Raman scattering or fluorescence) is collected. Resolution is improved by supporting a tiny conductive element (e.g., a silver particle) from a probe located within the optical beam area. The conductive element enhances the light emitted from molecules in the vicinity of the probe. The invention provides the high spatial resolution of microscopes such as the AFM with the high chemical detection sensitivity of surface enhanced Raman spectroscopy. This combination allows the isolation and differentiation of single molecules on surfaces of nanostructures.
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Shuming Nie and Steven R. Emory, Probing Single Molecules and Single Nanoparticles by Surface-Enhanced Raman Scattering, Feb. 21, 1997, Science vol. 275.
Katrin Kneipp, Yang Wang, Harold Kneipp, Lev T. Perelman, Irving Itzkan, Ramachandra R. Dasari, and Michael S. Feld, Single Molecule Detection Using Surface-Enhanced Raman Scattering (SERS), Mar. 3, 1997, The American Physical Society, Physical Review Letters vol. 78 No. 9.
F. Zenhausern, Y. Martin, H. K. Wickramasinghe, Scanning Interferometric Apertureless Microscopy: Optical Imaging at 10 Angstrom Resolution, Aug. 25, 1995, Science vol. 269.
California Institute of Technology
Evans F. L.
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