High resolution replicas

Metal founding – Process – Disposition of a gaseous or projected particulate molten...

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

427 4, 427250, B22D 2300

Patent

active

049678256

ABSTRACT:
Disclosed are improved methods for preparing high resolution replicas for electron microscopic analysis. Replicas are prepared having a resolution capability less than ten angstroms, with structures of even less than five angstroms being readily discernible. Particular aspects of the invention concern the use of a platinum/carbon evaporant to prepare extremely thin replica surfaces which allow the visualization of structures heretofore unresolvable. The replication is performed at high vacuum, on the order of 10.sup.-5 Torr or better, with continuous rotation of the sample to allow for an even distribution of the evaporant. The resultant replica surfaces are on the order of no more than 5 to 10 angstroms thick. The replica technology disclosed herein is applicable to both biological as well as non-biological samples, including tissues, biochemicals, metals and polymers and even computer chips and superconductor surfaces.

REFERENCES:
patent: 4278701 (1981-07-01), von Hagens
patent: 4447374 (1984-05-01), Tanaka
patent: 4582111 (1986-04-01), Kuehn et al.
Haigler et al. (1980), Science, 210:903-906.
Muller et al. (1985), Ultramicroscopy 16:340-348.
Ruben (1987), Carbohydrate Res., 160:434-443.
Zasadzinski et al. (1988), Science 239:1013-1015.
Elings (1988), Microscopy/Bioanalytical Techniques, Apr. pp. 124.
Amrein et al. (1988), Science, 240:514-516.
Fujikawa, Seizo, "Negative Staining", Journal of Microscopy, vol. 117, Pr. 2, (Nov. 1979), pp. 261-267.
Pickhardt, Vincent, "Fabrication of High-Strength Unsupported Metal Membranes", J. Vac. Sci. Technol., vol. 14, No. 3, (May/Jun. 1977), pp. 823-825.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

High resolution replicas does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with High resolution replicas, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and High resolution replicas will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1301749

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.