Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1997-05-30
2000-09-12
Nguyen, Vinh P.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
3241581, G01R 3126
Patent
active
061182931
ABSTRACT:
The present invention relates to a system for the measurement of a supply current of an electronic circuit, comprising:
REFERENCES:
patent: 5332973 (1994-07-01), Brown et al.
patent: 5351012 (1994-09-01), Toumazou
patent: 5352989 (1994-10-01), Toumazou et al.
patent: 5392293 (1995-02-01), Hsue
patent: 5608329 (1997-03-01), Imamura
patent: 5731700 (1998-03-01), McDonald
European Search Report for 97870078.9 dated Jul. 20, 1998.
Chen and Abraham (1991), "High Quality Tests for Switch-Level Circuits Using Current and Logic Test Generation Algorithms," International Test Conference, pp. 615-622 (Month Unavailable).
Hawkins et al. (1989), "Quiescent Power Supply Current Measurement for CMOS IC Defect Detection," IEEE Transactions on Industrial Electronics, vol. 36, pp. 211-218 (Month Unavailable).
Hawkins and Solen (1985), "Electrical Characteristics and Testing Considerations for Gate Oxide Shorts in CMOS ICs," IEEE Proceedings of International Test Conference, Philadelphia, Pennsylvania, pp. 544-555 (Month Unavailable).
Hsue and Lin (1993), "Built-In Current Sensor for I.sub.DDQ Test in CMOS," International Test Conference, pp. 635-641 (Month Unavailable).
Lupon et al. (1993), "Compact Bic Sensor for I.sub.ddq Testing of CMOS Circuits," vol. 29, pp. 772-774 (Month Unavailable).
Maly and Patyra (1992), Built-In Current Teseting, IEEE Journal of Solid-State Circuits, vol. 27, pp. 425-428 (Month Unavailable).
Manhaeve et al. (1994), "An Off-Chip IDDDq Current Measurement Unit for Telecommunication ASICs," pp. 203-212 (Month Unavailable).
Rius and Figueras (1992), "Proportional BIC Sensor for Current Testing," J. of Electrical Testing, vol. 3, pp. 387-396 (Month Unavailable).
Rubio et al. (1995), "A Built-In Quiescent Current Monitor For CMOS VLSI Circuits," IEEE, pp. 581-585 (Month Unavailable).
Shen et al. (1993), "A 2-ns Detecting Time, 2-.mu.m CMOS Built-In Current Sensing Circuit," IEEE Journal of Solid-State Circuits, vol. 28, pp. 72-77 (Month Unavailable).
Soden and Hawkins (1989), "Electrical Properties and Detection Methods for CMOS IC Defects," 1st European Test Conference, Paris France pp. 1-9 (Month Unavailable).
Wallquist et al. (1993), "A General Purpose I.sub.DDQ Measurement Circuit," International Test Conference, pp. 642-651 (Month Unavailable).
Kerckenaere Stefaan
Manhaeve Hans
Stopjakova Viera
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