High resolution postselector for time-of-flight mass spectromete

Details High resolution postselector for time-of-flight mass spectromete High resolution postselector for time-of-flight mass spectromete

1995-11-17

1998-05-19

Anderson, Bruce

Radiant energy

Ionic separation or analysis

Ion beam pulsing means with detector synchronizing means

250281, B01D 5944, H01J 4900

Patent

active

057539090

ABSTRACT:
A method and apparatus for analyzing ions by determining times of flight including using a collision cell to activate ions toward fragmentation and a deflector to direct ions away from their otherwise intended or parallel course. Deflectors are used as gates, so that particular ions may be selected for deflection, while others are allowed to continue along their parallel or otherwise straight path, from the ion source, through a flight tube, and eventually, to a detector. According to the present invention, a postselector, in the form of two deflection plates is used as an ion deflector and is encountered by ions after the collision cell as they progress through the spectrometer.

REFERENCES:
patent: 3634683 (1972-01-01), Bakker
patent: 4733073 (1988-03-01), Becker et al.
patent: 4894536 (1990-01-01), Conzemius
patent: 5045694 (1991-09-01), Beavis et al.
patent: 5144127 (1992-09-01), Williams et al.
patent: 5160840 (1992-11-01), Vestal

Affiliated with

Also associated with

Rating

High resolution postselector for time-of-flight mass spectromete does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with High resolution postselector for time-of-flight mass spectromete, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and High resolution postselector for time-of-flight mass spectromete will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1855110