High resolution microscoping system using convolution integratio

Details High resolution microscoping system using convolution integratio High resolution microscoping system using convolution integratio

1990-07-10

1991-08-27

Nelms, David C.

Radiant energy

Photocells; circuits and apparatus

Optical or pre-photocell system

359368, H01J 314

Patent

active

050435701

ABSTRACT:
An optical system including a wave source radiates a converging wave to an object. A first memory stores a function g (x,y) representing the intensity distribution of the converging wave at a substantially beam waist section thereof. A scanning system directs the converging wave on the object at a substantially beam waist position, and operates so as to scan the converging wave on the object. A detector detects the intensity of a secondary wave generated by interaction between the converging wave and the object in accordance with a scanning operation of the scanning means. A second memory stores a positional function I (x,y) representing the intensity distribution of the secondary wave detected by the detector. In order to obtain a sensitivity distribution representing the intensity of the interaction between the object and the converging wave, an arithmetic unit obtains a function f (x,y) such that the function I(x,y) stored in the second memory satisfies convolution integration of the function g (x,y) stored in the first memory and the function f(x,y).

REFERENCES:
patent: 4733063 (1988-03-01), Kimura et al.
patent: 4769698 (1988-09-01), Ledley et al.
patent: 4824229 (1989-04-01), Narita et al.
Image Recovery: Theory and Application; Academic Press, Inc.; H. Stark pp. V-IX.
The Bell System Technical Journal; Jan. 1961; D. Slepian & H. O. Pollak pp. 43-63.
IEEE Transactions on Circuits and Systems, vol. Cas-25; No. 9, Sep. 1978; pp. 694-702.

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