High resolution method for using time-of-flight mass...

Details High resolution method for using time-of-flight mass... High resolution method for using time-of-flight mass...

2005-03-01

2005-03-01

Berman, Jack I. (Department: 2881)

Radiant energy

Ionic separation or analysis

Methods

C250S287000, C250S283000

Reexamination Certificate

active

06861645

ABSTRACT:
The invention relates to a time-of-flight mass spectrometer in which a fine beam of ions is injected orthogonally into a fast pulser that pulses the ions from the fine ion beam into the spectrometer's drift region for precise determination of mass. The invention consists in increasing the duty cycle of the ions through the use of a high pulser frequency, recording the data cyclically at the same frequency, and assigning slow ions that are only measured in one of the subsequent cycles to the correct initiating pulse through the form of their lines or line patterns.

REFERENCES:
patent: 5396065 (1995-03-01), Myerholtz et al.
patent: 6285027 (2001-09-01), Chernushevich et al.
patent: 6373052 (2002-04-01), Hoyes et al.
patent: 6765199 (2004-07-01), Youngquist et al.
patent: 20030218129 (2003-11-01), Rather
patent: 2 390 936 (2004-01-01), None
patent: 0323994-4 (2004-04-01), None
patent: WO 9500236 (1995-01-01), None

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