High resolution interferometer with high etendue

Details High resolution interferometer with high etendue High resolution interferometer with high etendue

1988-11-10

1990-03-13

Willis, Davis L.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356236, G01B 902

Patent

active

049078879

ABSTRACT:
The etendue (throughput or area-solid angle product) of a high resolution interferometer is maintained at a substantially high level by use of a transparent chamber defined by a highly reflective internal surface, the chamber being located at the input to the interferometer. The chamber has an input aperture to admit light into the chamber and an output aperture or exit opening to pass light to the interferometer. By integrating the input light through multiple reflections thereof within the chamber until it exits to the interferometer, the etendue of the latter is substantially enhanced.

REFERENCES:
patent: 3795448 (1974-03-01), Fletcher et al.
Paul et al., "Rapid Velocity Sensor Using a Static Confocal Fabry-Perot and a Single Frequency Argon Laser", J. Phys. E, vol. 4, No. 3, pp. 170-172, 3/71.

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