Image analysis – Histogram processing – For setting a threshold
Patent
1991-02-13
1992-06-30
Razavi, Michael
Image analysis
Histogram processing
For setting a threshold
382 21, 382 27, 250310, G06K 900
Patent
active
051270641
ABSTRACT:
The present invention provides methods and apparatus for rapid compression of images composed of pixels into high-resolutions, compressed icon images, and for dynamic fault imaging of operating faults in integrated circuit devices employing such methods. Displaying a plurality of such icons juxtaposed on a screen permits ready tracing of a fault in an IC device under test, even by persons having little knowledge of the functionality of the devices.
In accordance with the invention, an image made up of n.times.n pixels may be compressed into an icon of p.times.p pixels, where n.dbd.P.multidot.q and q is an integer, by dividing the image into p tiles of q.times.q pixels, selecting q pixels from each tile, where each of said selected q pixels is representative of predetermined directional orientations within the tile, and calculating the mean value of the selected q pixels, to produce a single pixel representative of the tile. The pixels representative of said tiles thus form an icon of p.times.p pixels. Each of the selected q pixels is preferably uniquely representative of a horizontal row of q pixels, a vertical column of q pixels, and a pair of mutually-orthogonal diagonal lines of pixels of the tile. Edge enhancement may also be performed to sharpen the features of the resulting icon.
The invention further includes a method of dynamic imaging of operating faults in integrated circuit devices. The methods are preferably carried out in the general purpose processor of an engineering workstation, which may be associated with an electron beam test probe for acquisition of the images.
REFERENCES:
patent: 4677479 (1987-06-01), Hatori et al.
patent: 4706019 (1987-11-01), Richardson
patent: 4721909 (1988-01-01), Richardson
patent: 4764975 (1988-08-01), Inoue
patent: 4776030 (1988-10-01), Tzon
patent: 4782389 (1988-11-01), Mayweather, III
patent: 4831658 (1989-05-01), Umeda et al.
E. Menzel & E. Kubalek, Fundamentals of Electron Beam Testing of Integrated Circuits, 5 Scanning 103-122 (1983).
E. Plies & J. Otto, Voltage Measurement Inside Integrated Circuit Using Mechanical and Electron Probes, IV Scanning Electron Microscopy 1491-1500 (1985).
S. Concina, G. Liu, L. Lattanzi, S. Reyfman & N. Richardson, Software Integration in a Workstation Based E-Beam Tester, International Test Conference Proceedings (1986).
N. Richardson, E-Beam probing for VLSI Circuit Debug, VLSI Systems Design (1987).
T. May, G. Scott, E. Meieran, P. Wiener & V. Rao, Dynamic Fault Imaging of VLSI Random Logic Devices, International Physics Symposium Proceedings (1984).
W. Pratt, Digital Image Processing (1978), pp. 322-323.
H. Feuerbaum, Electron Beam Testing: Methods and Applications, 5 Scanning 14-24 (1983).
S. Daniel & L. Hampton, Diagnosing Yield Problems with E-Beam Probers, Semiconductor International (Aug. 1988).
S. Harari & C. Talbot, Chip Diagnosis: A New Methodology, Evaluation Engineering (Oct. 1987).
J. McLeod, A New Tool Dramatically Cuts VLSI Debugging time, Electronics (Apr. 30, 1987).
IDS 4000 Integrated Diagnostic System, (published by Schlumberger/ATE, Aug., 1988).
IDS 5000 Integrated Diagnostic System, (published by Schlumberger/ATE, May, 1988).
Solving the Navigational Problem in VLSI Debug, 1 Issues in VLSI Diagnostics & Test, No. 2 (published by Schlumberger/ATE, Oct., 1987).
S. Concina & N. Richardson IDS 5000: an integrated Diagnosis System for VLSI, 7 Microelectronic Engineering (1987).
Concina Stefano E.
Flinois Xavier A.
Jung Yon
Olsen Kenneth
Razavi Michael
Riter Bruce D.
Schlumberger Technologies Inc.
LandOfFree
High resolution image compression methods and apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with High resolution image compression methods and apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and High resolution image compression methods and apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1871254