Optics: measuring and testing – Refraction testing – Prism engaging specimen
Patent
1975-05-05
1976-08-31
Corbin, John K.
Optics: measuring and testing
Refraction testing
Prism engaging specimen
356244, 356209, 356114, G01B 902, G01J 400
Patent
active
039777871
ABSTRACT:
A high-resolution Fourier interferometer-spectrophotopolarimeter is provided using (i) a single linear polarizer-analyzer the transmission axis azimuth of which is positioned successively in the three orientations of 0.degree., 45.degree., and 90.degree., in front of a detector; (ii) four flat mirrors, three of which are switchable to either of two positions to direct an incoming beam from an interferometer to the polarizer-analyzer (1) around a sample cell (2) transmitted through a medium in a cell and (3) reflected by medium in the cell; and (iii) four fixed focussing lenses, all located in a sample chamber attached at the exit side of the interferometer. This arrangement can provide the distribution of energy and complete polarization state across the spectrum of (a) the reference light entering from the interferometer; (b) the same light after a fixed-angle reflection from the sample cell containing a medium to be analyzed; and (c) the same light after direct transmission through the same sample cell, with the spectral resolution provided by the interferometer.
REFERENCES:
patent: 3572951 (1971-03-01), Rothwarf
patent: 3687519 (1972-08-01), Mapes
patent: 3700334 (1972-10-01), Low et al.
patent: 3728030 (1970-06-01), Hawes
Fletcher James C. Administrator of the National Aeronautics and Space
Fymat Alain L.
Clark Conrad
Corbin John K.
Manning John R.
McCaul Paul F.
Mott Monte F.
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