Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1997-11-17
2000-11-21
Font, Frank G.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356334, G01J 318
Patent
active
061511129
ABSTRACT:
In accordance with the present invention, a high-resolution, compact spectrometer is provided for dispersing wavelengths .lambda. of an incoming beam for detection by a detector. The spectrometer comprises: (a) an entrance slit through which the incoming beam passes; (b) a first mirror for collimating the beam from the entrance slit; (c) a first reflectance grating for dispersing the collimated beam to form a beam having a spectral intensity distribution, the first reflectance grating having a number of grooves N.sub.1 ; (d) a second reflectance grating for further dispersing the collimated beam, the second reflectance grating having a number of grooves N.sub.2 ; and (e) a second mirror for focusing the collimated and dispersed beam, wherein the spectrometer has a substantially symmetrical construction. The symmetrical construction of the spectrometer doubles the resolution and dispersion of the gratings. The compact and high-resolution imaging spectrometer is capable of measuring the absorption lines of gases in high sensitivity gas sensors with an intracavity cell.
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P. Lindblom et al, "Spectroscopy with the MEGA spectrometer, a very-high-resolution grating spectrometer", Review of Scientific Instruments, vol. 61, No. 10, Part I, Oct. 1990.
Eugene Hecht, "Optics", Adelphi University, Addison-Wesley Publishing Company, Second Edition, Ch. 5, pp. 163-166.
Atkinson George H.
Yan Yu
Font Frank G.
Innovative Lasers Corp.
Smith Zandra V.
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