High resolution alignment interferometer

Details High resolution alignment interferometer High resolution alignment interferometer

1976-07-06

1977-12-06

Clark, Conrad J.

Optics: measuring and testing

Refraction testing

Prism engaging specimen

G01B 902

Patent

active

040614255

ABSTRACT:
In an interferometer a beam-splitter reflector such as a compound prism is provided having an interface and a base normal thereto. An entrance face and exit face are aligned with respect to the interface to provide a zero order interface fringe along an axis of one face when a reflecting surface such as an autocollimating mirror is parallel to the base. Also, the zero order interference fringe is fixed at the apex of the prism and rotates as a function of angular misalignment of the reflecting surface with respect to a plane parallel to the prism base. Position of the fringe is measured to provide a high resolution indicaton of angular misalignment of the reflecting surface.

REFERENCES:
patent: 2880644 (1959-04-01), Brockway et al.
patent: 3031914 (1962-05-01), Saunders
patent: 3285124 (1966-11-01), Lovins
patent: 3419898 (1968-12-01), Baldwin et al.

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