High resistivity aluminum antimonide radiation detector

Single-crystal – oriented-crystal – and epitaxy growth processes; – Processes of growth from liquid or supercritical state – Having pulling during growth

Reexamination Certificate

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C117S015000, C117S019000

Reexamination Certificate

active

11040573

ABSTRACT:
Bulk Aluminum Antimonide (AlSb)-based single crystal materials have been prepared for use as ambient (room) temperature X-ray and Gamma-ray radiation detection.

REFERENCES:
patent: 5391882 (1995-02-01), Rhiger
patent: 6331705 (2001-12-01), Eisen et al.
D.Shaw, et al, Tantalum doping and high resistivity in aluminium antimonide, Dec. 17, 1962, pp. 295-300.
Yee, J., et al., “AlSb As A High-Energy Photon Detector,” IEEE Transactions on Nuclear Sicence, vol. NS-24, No. 4, Aug. 1997, pp. 1962-1967.
Stallinga, P., et al., “Electron Paramagnetic Resonance Study of Se-doped AlSb: Evidence for Negative-U of the DX Center,” submitted to Phys. Rev. B, May 15, 1995, pp. 1-14.
Lin, C. T., et al., “Growth and Characterization of Doped and Undoped AlSb Single Crystals,” Journal of Crystal Growth 104, (1990), Elsevier Science Publishers B.V., pp. 653-660.
Lin, C. T., et. al., “On the Growth of AlSb Single Crystals,” Journal of Crystal Growth 94, (1989), Elsevier Science Publishers B.V., pp. 955-958.
Albers, W., “Preparation of Single-Phase Crystals of Compounds with Extremely Small Existence Regions,” The Journal of Chemical Physics, vol. 43, No. 12, Dec. 15, 1963, pp. 4401-4402.
Sherohman, J., “Two-Phase Annealing of Single Crystal CdS,” UCRL-84859 Preprint, Lawrence Livermore National Laboratory, Jul. 28, 1980, 15 pages.

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