High-rate groove pattern

Abrading – Flexible-member tool – per se – Interrupted or composite work face

Reexamination Certificate

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Details

C451S041000, C451S530000, C451S921000

Reexamination Certificate

active

08062103

ABSTRACT:
The invention provides a polishing pad useful for polishing at least one of a magnetic, optical and semiconductor substrate in the presence of a polishing medium with a polishing pad. The polishing pad comprises a center, an inner region surrounding the center, a transition region connecting grooves from the inner region to an outer region surrounding the inner region. The outer region has multiple grooves with a high-rate path. The transition region is adjacent the outer region and within a radius from the center defined as follows:rTR=0.7⁢r*⁢⁢to⁢⁢1.3⁢r*wherer*=RC⁢(RRC)2-cos⁡(2⁢θc⁢⁢0)-sin⁡(2⁢θc⁢⁢0)⁢(R/RCcos⁢⁢θc⁢⁢0)2-1;with the inner region originating continuous grooves that extend uninterrupted to the outer region.

REFERENCES:
patent: 6843711 (2005-01-01), Muldowney
patent: 7059949 (2006-06-01), Elmufdi et al.
patent: 7059950 (2006-06-01), Muldowney
patent: 7131895 (2006-11-01), Elmufdi et al.
patent: 7182677 (2007-02-01), Donohue et al.
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patent: 7311590 (2007-12-01), Muldowney
patent: 7329174 (2008-02-01), Hosaka et al.
patent: 7520798 (2009-04-01), Muldowney
patent: 2008/0182489 (2008-07-01), Muldowney
patent: 2008/0182493 (2008-07-01), Muldowney

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