Single-crystal – oriented-crystal – and epitaxy growth processes; – Apparatus – With means for measuring – testing – or sensing
Patent
1993-10-28
1994-12-27
Breneman, R. Bruce
Single-crystal, oriented-crystal, and epitaxy growth processes;
Apparatus
With means for measuring, testing, or sensing
117220, 117224, 117907, 117943, 118726, 4222451, C23C 1600
Patent
active
053755570
ABSTRACT:
An apparatus (10) and method are provided for directly viewing, through a viewport assembly (26), the process for forming a layer of mercury cadmium telluride of a predetermined composition on a surface of a wafer (not shown). According to the invention, a molten melt (20) comprising mercury, cadmium and tellurium is provided in a vertically oriented crystal growth chamber (14), which, in turn, is housed in a reactor tube (12). A wafer (not shown) is contacted with the crystal growth melt while cooling the melt below its liquidus temperature at a predetermined rate sufficient to cause a crystal growth layer of mercury cadmium telluride to form on the wafer (not shown). Viewports (26, 48) located approximately radially adjacent to the melt (22) provide direct see through capability to visually monitor the crystal growth process. The present invention is advantageous because the apparatus and method disclosed provide for ease of the growth set-up and operation, yielding mercury cadmium telluride layers of uniform composition and of high purity.
REFERENCES:
patent: 3051558 (1962-08-01), Jost
patent: 3481711 (1969-12-01), Maruyama
patent: 3639718 (1972-02-01), Castonguay et al.
patent: 4401487 (1983-08-01), Lockwood
patent: 5074953 (1991-12-01), Shirata et al.
patent: 5082635 (1992-01-01), Wakatsuki et al.
Breneman R. Bruce
Carlson Brian A.
Donaldson Richard L.
Kesterson James C.
Paladugu Ramamohan Rao
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