High precision apparatus for imposing or measuring a...

Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified load or strain transmission device from specimen...

Reexamination Certificate

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Reexamination Certificate

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06871548

ABSTRACT:
High precision apparatus is described which can be arranged and used in the form of manipulators, actuators, position transducers or force transducers, having four to six degrees of freedom. A movable platform (2), to which the object (3) subjected to movements or forces is fixed, is connected to a base (1) of the apparatus by six links in parallel. These links comprise articulated kinematic units (11-16) each comprising a deformable parallelogram and an articulated transmission device connecting the parallelogram to the platform (2). The parallelogram is associated with a position sensor and an electromagnetic transducer, such as a linear motor.

REFERENCES:
patent: 4042051 (1977-08-01), Ricciardi
patent: 5029398 (1991-07-01), Ertl
patent: 5419669 (1995-05-01), Kremer et al.
patent: 5656905 (1997-08-01), Tsai
patent: 6688183 (2004-02-01), Awtar et al.
patent: 937 961 (1999-08-01), None
patent: 1 113 191 (2001-07-01), None
patent: WO 02 16092 (2002-02-01), None
Patent Abstracts of Japan, vol. 017, No. 206, Apr. 22, 1993 & JP 04 348834 (Yaskawa Electric Corp.), Dec. 3, 1992.
Patent Abstracts of Japan, vol. 2002, No. 04, Aug. 4, 2002 & JP 2001 349323, Dec. 21, 2001.

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