Optical: systems and elements – Diffraction – From grating
Patent
1992-01-02
1994-06-21
Sikes, William L.
Optical: systems and elements
Diffraction
From grating
359569, 359350, G02B 100, G02B 518
Patent
active
053232674
ABSTRACT:
A beam sampler comprises a substrate made of highly transparent fused silica or zinc selenide, both capable of sustaining high power laser beams. The substrate defines an outer surface through which the light beam being sampled propagates. A sinusoidal diffracting relief is etched on this outer surface directly into the light-propagating material of the substrate. When a light beam propagates through the outer surface of the substrate, the three-dimensional diffracting relief extracts from this light beam at least one pair of low power beam samples.
REFERENCES:
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patent: 4426130 (1984-01-01), Knop
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patent: 4806454 (1989-02-01), Yoshida et al.
patent: 5113286 (1992-05-01), Morrison
patent: 5238785 (1993-08-01), Ohkura et al.
Belanger Michel
Cote Marie
Frechette Julie
Galarneau Pierre
Langlois Pierre
Gentec Inc.
Parsons David R.
Sikes William L.
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