High performance tunneling-biased MOSFET and a process for...

Active solid-state devices (e.g. – transistors – solid-state diode – Thin active physical layer which is – Ballistic transport device

Reexamination Certificate

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C257S360000

Reexamination Certificate

active

11081993

ABSTRACT:
A semiconductor structure and a method for its manufacture are provided. In one example, the structure includes a well region doped with a first type dopant (e.g., a P-type or N-type dopant). A gate pedestal formed over the well region has two ends, one of which at least partially overlies the well region and is doped with the first type dopant. A dielectric layer is positioned between the gate pedestal and the well region. Source and drain regions formed on opposite sides of the gate pedestal within the well region are doped with a second type dopant opposite in type to the first type dopant.

REFERENCES:
patent: 5401998 (1995-03-01), Chiu et al.
patent: 5972745 (1999-10-01), Kalter et al.
patent: 6261878 (2001-07-01), Doyle et al.
patent: 6268629 (2001-07-01), Noguchi
patent: 6306691 (2001-10-01), Koh
patent: 6518105 (2003-02-01), Yang et al.
patent: 6548866 (2003-04-01), Noguchi
patent: 6674130 (2004-01-01), Yang et al.
patent: 2002/0047155 (2002-04-01), Babcock et al.
patent: 2003/0168701 (2003-09-01), Voldman

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