High performance optoelectronic and electronic inversion...

Active solid-state devices (e.g. – transistors – solid-state diode – Thin active physical layer which is – Heterojunction

Reexamination Certificate

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C257S184000, C257S187000, C257S192000, C257S194000, C257S195000, C257S197000, C257S198000, C372S045013

Reexamination Certificate

active

06849866

ABSTRACT:
A family of high speed transistors and optoelectronic devices are obtained on a monolithic substrate by adding two sheets of planar doping together with a wideband cladding layer to the top of a pseudomorphic high electron mobility transistor (PHEMT) structure. The two sheets are of the same polarity which is opposite to the modulation doping of the PHEMT and they are separated by a lightly doped layer of specific thickness. The combination is separated from the PHEMT modulation doping by a specific thickness of undoped material. The charge sheets are thin and highly doped. The top charge sheet achieves low gate contact resistance and the bottom charge sheet defines the capacitance of the field-effect transistor (FET) with respect to the modulation doping layer of the PHEMT. The structure produces a pnp bipolar transistor, enhancement and depletion type FETs, a vertical cavity surface emitting laser, and a resonant cavity detector.

REFERENCES:
patent: 5010374 (1991-04-01), Cooke et al.
“Theoretical and experimental results for the inversion channel heterostructure field effect transistor” by Taylor et al., IEE Proceedings-G, vol. 140, No. 6. Dec. 1993, p. 392 to p. 400.

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