High NA system for multiple mode imaging

Optical: systems and elements – Compound lens system – With curved reflective imaging element

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C359S357000, C359S726000

Reexamination Certificate

active

07035001

ABSTRACT:
A system for multiple mode imaging is disclosed. The catadioptric system has an NA greater than 0.65, and preferably greater than 0.9, highly corrected for low and high order monochromatic aberrations. The system employs unique illumination entrances and optics to collect reflected, diffracted, and scattered light over a range of angles. Multiple imaging modes are possible by varying the illumination geometry and apertures at the pupil plane. Illumination can enter the catadioptric optical sytems using an auxiliary beamsplitter or mirror, or through the catadioptric elements at any angle from 0 to 85 degrees from vertical. The system may employ a relayed pupil plane, used to select different imaging modes, provide simultaneous operation of different imaging modes, Fourier filtering, and other pupil shaping operations.

REFERENCES:
patent: 1973066 (1934-09-01), Hauser et al.
patent: 2661658 (1953-12-01), Dyson
patent: 4758088 (1988-07-01), Doyle
patent: 4898471 (1990-02-01), Vaught et al.
patent: 4974094 (1990-11-01), Morito
patent: 5031976 (1991-07-01), Shafer
patent: 5177559 (1993-01-01), Batchelder et al.
patent: 5428442 (1995-06-01), Lin et al.
patent: 5488229 (1996-01-01), Elliott et al.
patent: 5644140 (1997-07-01), Biedermann et al.
patent: 5717518 (1998-02-01), Shafer et al.
patent: 6064517 (2000-05-01), Chuang et al.
patent: 6392793 (2002-05-01), Chuang et al.
patent: 3742806 (1989-07-01), None
patent: 9712226 (1997-04-01), None
M.R. Bartz et al., “LED Print Analyzer,” IBM Technical Disclosure Bulletin, vol. 14, No. 3, Aug. 1971.
D.S. Goodman, “Darkfield Illuminator Attachment,” IBM Technical Disclosure Bulletin, vol. 27, No. 5, Oct. 1984.
J.L.C. Sanz et al., “Automated Visual Inspection with Dark-Field Microscopy,” Journal of the Optical Society of America, Nov. 1985, USA, vol. 2, No. 11, pp. 1857-1862.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

High NA system for multiple mode imaging does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with High NA system for multiple mode imaging, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and High NA system for multiple mode imaging will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3595876

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.