High intensity Fourier spectrometer

Details High intensity Fourier spectrometer High intensity Fourier spectrometer

1983-11-04

1986-07-22

Willis, Davis L.

Optics: measuring and testing

By particle light scattering

With photocell detection

350453, G01J 345

Patent

active

046015795

ABSTRACT:
A system for reducing wavelength error caused by angular motion of the moving mirror of an interferometer, such as a Michelson interferometer having fore-optics introducing a beam of radiant energy for impingement on the moving mirror, teaches reducing, without necessary loss of energy, the width of the beam before impingement on the moving mirror; other advantages also accrue to use of the reduced width beam, such as facility in use of absorption cells and multiplying clear path length, when desired.

REFERENCES:
patent: 3216314 (1965-11-01), Morokuma
patent: 3976739 (1976-08-01), Morokuma
patent: 4084909 (1978-04-01), Mathiesen
patent: 4095900 (1978-06-01), Murphy et al.
patent: 4345838 (1982-08-01), Buijis et al.
Hanel, "Fourier Spectroscopy on Planetary Missions Including Voyager", Proc. SPIE, vol. 289, pp. 331-344, 1981.

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