Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2003-03-17
2009-06-30
Hollington, Jermele M (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
07554347
ABSTRACT:
Optoelectronic probe cards, methods of fabrication, and methods of use, are disclosed. Briefly described, one exemplary embodiment includes an optoelectronic probe card adapted to test an electrical quality and an optical quality of an optoelectronic structure under test having electrical and optical components.
REFERENCES:
patent: 4786876 (1988-11-01), Graham
patent: 5124931 (1992-06-01), Iwamatsu et al.
patent: 5187431 (1993-02-01), Libretti
patent: 5254939 (1993-10-01), Anderson et al.
patent: 5363038 (1994-11-01), Love
patent: 5428298 (1995-06-01), Ko
patent: 5432878 (1995-07-01), Smous
patent: 5477168 (1995-12-01), Thijssen et al.
patent: 5493236 (1996-02-01), Ishii et al.
patent: 5506498 (1996-04-01), Anderson et al.
patent: 5606410 (1997-02-01), Peclier et al.
patent: 5656942 (1997-08-01), Watts et al.
patent: 5691651 (1997-11-01), Ehlermann
patent: 5701309 (1997-12-01), Gearhardt et al.
patent: 5773951 (1998-06-01), Markowski et al.
patent: 5914684 (1999-06-01), Brettner, III
patent: 5929646 (1999-07-01), Patel et al.
patent: 6292003 (2001-09-01), Fredrickson et al.
patent: 6292005 (2001-09-01), Suga
patent: 6297658 (2001-10-01), Nakata et al.
patent: 6300786 (2001-10-01), Doherty et al.
patent: 6307392 (2001-10-01), Soejima et al.
patent: 6323663 (2001-11-01), Nakata et al.
patent: 6333635 (2001-12-01), Lee et al.
patent: 6340895 (2002-01-01), Uher et al.
patent: 6344754 (2002-02-01), Tamai
patent: 6348810 (2002-02-01), Yanagawa et al.
patent: 6375347 (2002-04-01), Bruce et al.
patent: 6747464 (2004-06-01), Blackwood
patent: 6785458 (2004-08-01), Mule′et al.
patent: 6800424 (2004-10-01), Xu et al.
patent: 6850052 (2005-02-01), Iino et al.
patent: 7038288 (2006-05-01), Lai et al.
patent: 2003/0025495 (2003-02-01), Ilno et al.
Chen, et al., Fully Embedded Board-Level Guided-Wave Optoelectronic Interconnects; Jun. 2000; Proceedings of the IEEE, vol. 88, No. 6, pp. 780-793.
Naeemi, et al., Sea of Leads: A Disruptive Paradigm for a System-on-a-Schip (SoC); 2001; Digest of Technical Papers; pp. 280-281.
Lionel C. Kimerling; Silicon Microphotonics; 2000; Applied Surface Science; pp. 8-13.
Bakir Muhannad
Gaylord Thomas K.
Kohl Paul
Martin Kevin P.
Meindl James D.
Georgia Tech Research Corporation
Hollington Jermele M
Nguyen Trung Q
Thomas Kayden Horstemeyer & Risley LLP
LandOfFree
High input/output density optoelectronic probe card for... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with High input/output density optoelectronic probe card for..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and High input/output density optoelectronic probe card for... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4067200