High impedance fast voltage probe

Details High impedance fast voltage probe High impedance fast voltage probe

1980-10-20

1983-11-29

Tokar, Michael J.

Electricity: measuring and testing

Testing potential in specific environment

Voltage probe

324149, 324158P, G01R 3102

Patent

active

044183143

ABSTRACT:
A fast risetime, high voltage, high impedance voltage probe utilizes a parallel R-C divider with damping and compensation circuitry to allow measurement of voltage from DC to picosecond pulses. A unique feature of this probe is its construction. The performance of this device is made possible by utilizing microwave chip components on a planar circuit used as the center conductor of a coaxial transmission line.

REFERENCES:
patent: 2883619 (1959-04-01), Kobbe et al.
patent: 3532982 (1970-10-01), Zeidlhack
patent: 4051432 (1977-09-01), Sarjeant
Stover et al., "Nanosecond Pulsers for MM Wave Tubes", Research and Develent Technical Report DELET-TR-78-2991-3, Feb. 1980, Prepared for U.S. Army Electronics Technology and Devices Labs., Fort Monmouth, N.J. 07703.
C. P. Meadows, "An hf Probe for an Oscilloscope", Radio Communication, vol. 56, No. 12, Dec. 1980, pp. 1284 and 1285.
W. J. Sarjeant et al., "High-Voltage Probe System with Subnanosecond Rise Time", Rev. Sci. Inst., vol. 47, No. 10, pp. 1283-1287, (Oct. 1976).

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