Electricity: electrical systems and devices – Safety and protection of systems and devices – Load shunting by fault responsive means
Reexamination Certificate
2006-03-15
2009-12-29
Fleming, Fritz M. (Department: 2836)
Electricity: electrical systems and devices
Safety and protection of systems and devices
Load shunting by fault responsive means
C361S091500
Reexamination Certificate
active
07639464
ABSTRACT:
In a dual direction ESD protection structure, first and second NMOS devices are serially connected back-to-back by connecting their drains or their sources using a common floating interconnect, while ensuring that the devices remain isolated from each other.
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Hopper Peter J.
Vashchenko Vladislav
Fleming Fritz M.
National Semiconductor Corporation
Thomas Lucy
Vollrath Jurgen K.
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