High frequency test fixture

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

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324 73PC, 324158P, G01R 3102

Patent

active

045742367

ABSTRACT:
A high frequency test fixture (90) comprises a plurality of double-sided spring-loaded backdriving pins (99) positioned between a circuit board under test (41) and a stripline board (91) connected to an electronic tester. The double-sided backdriving pins (99) are located within through holes (98) of a ground plane (94) interposed between the circuit board (41) and the stripline (91). The top and bottom surfaces (96, 97) of the ground plane (94), respectively facing the circuit board (41) and the stripline board (91), are coated with an insulating material (68, 69). A plurality of pairs of spring-loaded ground pins (109, 111) are located in the ground plane (94) adjacent to the backdriving pins (99). In order to substantially reduce the inductance of the loop formed by the stripline board (91), a pair of backdriving pins (99), the circuit board (41) and a pair of ground pins (109, 111), the latter are separated thereby forcing a high frequency current path along the outside perimeter of the ground plane (94) instead of across the ground pins of one pair (FIG. 4).

REFERENCES:
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patent: 4289367 (1981-09-01), Everett
patent: 4352061 (1982-09-01), Matrone
patent: 4357062 (1982-11-01), Everett
Valentine, E. et al., "Conductive Epoxy Encapsulated Wafer Probe", IBM Tech. Disc. Bull., vol. 20, No. 11B, Apr. 1978, pp. 4797-4798.
IBM Technical Disclosure Bulletin, vol. 21, No. 4, "Automatic Test Equipment Translator Board", Burbank, K., et al., Sep. 1978, pp. 1404-1405.
IBM Technical Disclosure Bulletin, vol. 18, No. 3, "High-Performance AC Chip Contactor", Morton, R., et al., Aug. 1975, pp. 749-750.
Catalog from Augat Pylon of Attleboro Mass. "Instructions for Finishing Pylon Flip-Top Fixtures", Apr. 1982.

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