High frequency measuring circuit

Measuring and testing – Gas analysis – By vibration

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Details

73 2321, 73579, 73658, H03K 1314, G01R 2302, G01R 2314, H03M 110

Patent

active

061614203

ABSTRACT:
An electrical circuit and method for measuring small variations in a high frequency signal is disclosed. The circuit generates a coarse measurement of the input signal frequency and a reference signal having the same frequency as the frequency represented by the coarse measurement. The circuit measures the difference in frequency between the input signal and the reference signal, and adds the coarse measurement and the difference measurement to determine the frequency of the input signal. The circuit may be used in conjunction with a piezoelectric acoustic wave device and oscillator to provide an apparatus for accurately measuring low concentrations of a gas.

REFERENCES:
patent: 3144762 (1964-08-01), Testerman et al.
patent: 3385100 (1968-05-01), Michael
patent: 3392571 (1968-07-01), Roof
patent: 3581304 (1971-05-01), Paradise et al.
patent: 3750014 (1973-07-01), Glaw, Jr.
patent: 3879992 (1975-04-01), Barterg
patent: 4150561 (1979-04-01), Zupanick
patent: 4198606 (1980-04-01), Baba
patent: 4215308 (1980-07-01), Kusters
patent: 4345206 (1982-08-01), Skalka
patent: 4351181 (1982-09-01), Currans
patent: 4418566 (1983-12-01), Beck et al.
patent: 4533867 (1985-08-01), Witczak
patent: 4544884 (1985-10-01), Hayashi
patent: 4555932 (1985-12-01), Crosby, Jr.
patent: 4603301 (1986-07-01), Dukes et al.
patent: 4616173 (1986-10-01), Cook et al.
patent: 4647847 (1987-03-01), Roos
patent: 4651089 (1987-03-01), Haigh
patent: 4730478 (1988-03-01), Gedeon
patent: 4760536 (1988-07-01), Curtis
patent: 4786861 (1988-11-01), Hulsing, II et al.
patent: 4788646 (1988-11-01), Herzl
patent: 4799020 (1989-01-01), English
patent: 4843328 (1989-06-01), Greenhall
patent: 4903023 (1990-02-01), Evans et al.
patent: 5065140 (1991-11-01), Neuburger
patent: 5076094 (1991-12-01), Frye et al.
patent: 5201215 (1993-04-01), Granstaff et al.
patent: 5235844 (1993-08-01), Bonne et al.
patent: 5313820 (1994-05-01), Aylsworth
patent: 5465608 (1995-11-01), Lokshin et al.
patent: 5471402 (1995-11-01), Owen
patent: 5539346 (1996-07-01), Goto et al.
patent: 5571944 (1996-11-01), Pfeifer et al.
patent: 5604335 (1997-02-01), Isahaya
patent: 5658732 (1997-08-01), Ebersole et al.
patent: 5661233 (1997-08-01), Spates et al.

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