Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent
1987-10-26
1989-06-06
Karlsen, Ernest F.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
324 73PC, 324158F, G01R 106, G01R 3102
Patent
active
048375071
ABSTRACT:
A high frequency test fixture (40) comprises an array of Euler column probes (57,58,59) positioned between a circuit board or substrate under test (41) and a routing board or substrate (42) connected to an electronic tester. The Euler column probes are held in a compliant conducting medium (53) interposed between the circuit under test and the routing board. Electrical insulation (67,68) is placed around each alternate probe of the array of probes to isolate it from the compliant conducting medium. Such an alternate probe is to be used as a test signal driving probe. The probes adjacent to and surrounding a test signal driving probe are in electrical contact with the compliant medium and are to be used as ground probes. A high frequency test signal applied to the circuit under test via one of the alternate probes follows a return current path along the outside perimeter of the compliant medium thereby substantially reducing noise and effective lead inductance of the test fixture (FIG. 2).
REFERENCES:
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patent: 3731191 (1973-05-01), Bullard et al.
patent: 4164704 (1979-08-01), Kato et al.
patent: 4574236 (1986-03-01), Hechtman
Morton et al; "High-Performance AC Chip Contactor"; IBM Tech. Dis. Bull.; l. 18; No. 3; Aug. 1975; pp. 749-750.
R. T. Adsmond & H. P. Byrnes, "Pin Sensor for Parts Identification", IBM Tech. Discl. Bul., vol. 13, No. 9, Feb. 1971, p. 2619.
A. W. Till, "Column Contact Probe", IBM Tech. Discl. Bul., vol. 12, No. 4, Sep. 1969, p. 551.
DIT-MCO International Corp. of Kansas City, MO on the SAF-1 Substrate Test Access Fixture.
American Telephone and Telegraph Company AT&T Technologies, Inc.
Karlsen Ernest F.
Levy Robert B.
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