Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Analysis of complex waves
Reexamination Certificate
2005-04-07
2008-07-01
Gutierrez, Diego (Department: 2858)
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
Analysis of complex waves
C324S617000, C324S621000, C324S076590, C327S261000, C327S172000
Reexamination Certificate
active
07394238
ABSTRACT:
A high frequency delay circuit operable to output a high frequency signal delayed for a desired delay time. The high frequency delay circuit includes: a variable delay circuit operable to receive a reference signal of which a frequency is lower than the high frequency signal, and to output a delay reference signal delayed from the reference signal for the desired delay time in advance; and a multiplier operable to generate the high frequency signal, of which a frequency is a frequency of the delay reference signal multiplied by a predetermined value, and to output the generated high frequency signal at timing according to a phase of the delay reference signal.
REFERENCES:
patent: 3986113 (1976-10-01), Vifian
patent: 4374358 (1983-02-01), Hirose
patent: 4710705 (1987-12-01), Kawabata
patent: 5179438 (1993-01-01), Morimoto
patent: 6351756 (2002-02-01), Taniyoshi
patent: 51-60138 (1976-05-01), None
patent: 4-145793 (1992-05-01), None
patent: 09-064702 (1997-03-01), None
patent: 10-163830 (1998-06-01), None
patent: 2001-016097 (2001-01-01), None
patent: 2001-251184 (2001-09-01), None
Patent Abstracts of Japan, Publication No. 04-145793 dated May 19, 1992, 1 page.
Patent Abstracts of Japan, Publication No. 2001-251184 dated Sep. 14, 2001, 1 page.
Patent Abstracts of Japan, Publication No. 2001-016097 dated Jan. 19, 2001, 1 page.
Patent Abstracts of Japan, Publication No. 10-163830 dated Jun. 19, 1998, 1 page.
Patent Abstracts of Japan, Publication No. 09-064702 dated Mar. 7, 1997, 1 page.
International Search Report issued in PCT/JP2004/17553, mailed Jan. 11, 2005, 4 pages.
Ochiai Katsumi
Sekino Takashi
Advantest Corporation
Gutierrez Diego
Osha & Liang LLP
Zhu John
LandOfFree
High frequency delay circuit and test apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with High frequency delay circuit and test apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and High frequency delay circuit and test apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3965120