Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate
2011-08-23
2011-08-23
Larkin, Daniel S (Department: 2856)
Measuring and testing
Surface and cutting edge testing
Roughness
C850S021000, C850S033000, C850S062000
Reexamination Certificate
active
08001830
ABSTRACT:
An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Such a technique implemented in a commercially viable analytical instrument would be extremely useful. Various aspects of the experimental set-up have to be changed to create a commercial version. The invention addresses many of these issues thereby producing a version of the analytical technique that cab be made generally available to the scientific community.
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Dazzi Alexandre
Kjoller Kevin
Prazeres Rui
Reading Michael
Anasys Instruments, Inc.
Larkin Daniel S
Rodgers Mark
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