Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-09-06
2005-09-06
Chaudhuri, Olik (Department: 2823)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
06940298
ABSTRACT:
A probe assembly for use with a calibration/validation robot to calibrate/validate a plurality of semiconductor tester channels is disclosed. The probe assembly includes a bracket adapted for mounting to the robot and a probe element for engaging test points disposed on the semiconductor tester channels. A magnetic attach/release mechanism cooperates with the bracket and probe element to allow for the separation of the probe element from the bracket whenever the probe element meets a force that exceeds a predetermined value.
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Caradonna Michael
Chow Norman
Gutfeldt Theodore A.
Patel Sarosh M.
Chaudhuri Olik
Malsawma Lex H.
Teradyne, Inc.
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