Active solid-state devices (e.g. – transistors – solid-state diode – Regenerative type switching device – Having only two terminals and no control electrode – e.g.,...
Reexamination Certificate
2007-03-09
2010-12-07
Jackson, Jr., Jerome (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Regenerative type switching device
Having only two terminals and no control electrode , e.g.,...
C257S155000, C257S156000, C257SE29110, C257SE29325
Reexamination Certificate
active
07847315
ABSTRACT:
A high-efficiency power semiconductor rectifier device (10) comprising a δP++ layer (12), a P-body (14), an N-drift region (16), an N+ substrate (18), an anode (20), and a cathode (22). The method of fabricating the device (10) comprises the steps of depositing the N-drift region (16) on the N+ substrate (18), implanting boron into the N-drift region (16) to create a P-body region (14), forming a layer of titanium silicide (56) on the P-body region (14), and concentrating a portion of the implanted boron at the interface region between the layer of titanium silicide (56) and the P-body region (14) to create the δP++ layer (12) of supersaturated P-doped silicon.
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S. P. Murarka “Silicide for VLSI Applications” by Academic Press, 1983, p. 167.
Chen Zerui
Chiem Johnny Duc Van
Eastman Timothy
Hamerski Roman J.
Hong James Man-Fai
Chen Yu
Diodes Fabtech Inc.
Jackson, Jr. Jerome
Spencer Fane Britt & Browne LLP
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