Optics: measuring and testing – By dispersed light spectroscopy – With raman type light scattering
Reexamination Certificate
2006-02-15
2010-02-02
Evans, F. L (Department: 2877)
Optics: measuring and testing
By dispersed light spectroscopy
With raman type light scattering
Reexamination Certificate
active
07656524
ABSTRACT:
The present invention relates generally to the field of spectroscopy, and more particularly to tip-enhanced Raman spectroscopy that provides an enhanced contrast-ratio of a near-field Raman signal to a background signal. The near-field Raman signal is captured from a small volume of material near a metal-coated tip thereby achieving submicron lateral resolution.
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Hartschuh Ryan D.
Kisliuk Alexander
Lee Nam-Heui
Mehtani Disha
Sokolov Alexei P.
Crimaldi Joseph J.
Evans F. L
Roetzel & Andress
The University of Akron
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