High clarity mass spectrometer capable of multiple simultaneous

Details High clarity mass spectrometer capable of multiple simultaneous High clarity mass spectrometer capable of multiple simultaneous

1985-01-28

1987-01-20

Anderson, Bruce C.

Radiant energy

Ionic separation or analysis

Static field-type ion path-bending selecting means

250396R, H01J 4932

Patent

active

046381600

ABSTRACT:
Between the electrostatic sector (SE 23) and the magnetic sector (SM 30) of a mass spectrometer, there is provided a quadrupole (QP 26) which applies parallel beams to the magnetic sector whose inclination depends on the energy dispersion of the particles. A slotted lens (LF 27) corrects the divergence of the quadrupole in the perpendicular plane. A suitable relationship between the angle of the inlet face of the magnetic sector (SM 30) and the deflection angle provided thereby ensures that the second order aperture aberrations of the magnetic sector are corrected. The chromatic aberrations may be corrected by means of a hexapole (HP 25) centered on the focus of the quadrupole (QP 26). Another hexapole (HP 22) placed upstream from the electrostatic sector (SE 23) level with a constriction in vertical section of the particle beam serves to correct second order aperture aberrations related to the electrostatic sector (SE 23).

REFERENCES:
patent: 3622781 (1971-11-01), Liebl
patent: 4389571 (1983-06-01), Crewe
patent: 4418280 (1983-11-01), Matsuda

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