High-brightness gallium-nitride based light emitting diode...

Active solid-state devices (e.g. – transistors – solid-state diode – Incoherent light emitter structure – With housing or contact structure

Reexamination Certificate

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C257S013000, C257SE33043

Reexamination Certificate

active

11266461

ABSTRACT:
A GaN-based LED structure is provided so that the brightness and luminous efficiency of the GaN-based LED are enhanced effectively. The greatest difference between the GaN-based LEDs according to the invention and the prior arts lies in the addition of a masking buffer layer and a roughened contact layer on top of the masking buffer layer. The masking buffer layer contains randomly distributed clusters made of a group-IV nitride SixNy(x,y≧1), a group-II nitride MgwNz(w,z≧1), or a group-III nitride AlsIntGa1−s−tN (0≦s,t<1, s+t≦1) heavily doped with at least a group-II and group-IV element such as Mg and Si. The roughened contact layer, made of AluInvGa1−u−vN (0≦u,v<1, u+v≦1), starts from the top surface of an underlying second contact layer not covered by the masking buffer layer's clusters, and then grows upward until it passes (but does not cover) the clusters of the masking buffer layer for an appropriate distance. The total internal reflection that could have been resulted from the GaN-based LEDs' higher index of refraction than that of the atmosphere could be avoided.

REFERENCES:
patent: 6291839 (2001-09-01), Lester
patent: 6900473 (2005-05-01), Yoshitake et al.

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