Patent
1981-02-04
1984-04-17
Davie, James W.
357 35, 357 51, H01L 2944, H01L 2704, H01L 2972
Patent
active
044438125
ABSTRACT:
A high-breakdown-voltage semiconductor device wherein a resistor body made of a P-type impurity region is disposed in a surface region of an N-type semiconductor body so as to form a resistor element, a P-type low doped region is disposed around the resistor body, and a plate layer which extends from a high potential electrode of the resistor body covers a main part of the P-type low doped region.
REFERENCES:
patent: 4161742 (1979-07-01), Kane
patent: 4319262 (1982-03-01), Bertotti et al.
Imaizumi Ichiro
Kimura Masatoshi
Koda Toyomasa
Ochi Shikayuki
Yamaguchi Takashi
Davie James W.
Hitachi , Ltd.
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