High breakdown lateral PNP transistor

Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – With pn junction isolation

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257552, 257556, 257557, 257558, 257563, 257565, 257575, 257576, H01L 2972, H01L 2702, H01L 2704

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active

053550153

ABSTRACT:
A lateral pnp transistor for use in programmable logic arrays. The lateral pnp has a layer of oxide disposed between a polysilicon layer and the base along the base width. The oxide layer prevents diffusion of the N+ dopant contained in the polysilicon layer into the N- base region. The base region thus remains N- and the resulting transistor has improved breakdown voltage characteristics while retaining the speed advantages of polysilicon contact layers. The lateral pnp transistor is manufactured by a method which requires minimal deviation from other methods used to manufacture lateral pnp transistors.

REFERENCES:
patent: 3667008 (1972-05-01), Katnack
patent: 4998155 (1991-03-01), Watanabe et al.
patent: 5001533 (1991-03-01), Yamaguchi
patent: 5014107 (1991-05-01), Vera
patent: 5027184 (1991-06-01), Soclof
Bhattacharyya et al., "Dual Base Lateral Bipolar Transistor", IBM Technical Disclosure Bulletin, vol. 20 No. 4, Sep. 1977.
Wieder, "Processing for a Lateral PNP Transistor in the Submicron Range", IBM Technical Disclosure Bulletin, vol. 21 No. 10, Mar. 1979.
IBM Corp. Technical Disclosure Bulletin, "Enclosed Lateral PNP Transistor", vol. 29 No. 3, Aug. 1986.

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