High activity, spatially distributed radiation source for...

Details High activity, spatially distributed radiation source for... High activity, spatially distributed radiation source for...

2005-07-05

2005-07-05

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754120, C365S201000, C714S719000, C714S735000, C714S824000

Reexamination Certificate

active

06914447

ABSTRACT:
The present invention pertains to radiation sources that mimic radiation environment(s) encountered by packaged semiconductor devices. The sources are suitable for use in test systems operative to test for soft error and/or failure rates in devices sensitive to such radiation. The radiation is highly active to exacerbate soft error rates and thereby accelerate testing and reduce test times. The sources are also relatively uniformly distributed within a medium to simulate the direction(s) and energy spectra of radiation that would actually be encountered by semiconductor devices in device operation.

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“The Impact of Technology Scaling on Soft Error Rate Performance and Limits to the Efficacy of Error Correction”, Institute of Electrical and Electronics Engineers (IEEE) International Electron Devices Meeting (IEDM), Robert Baumann, Dec., 2002, 4 pages.

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