Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Earth science
Reexamination Certificate
2008-05-20
2008-05-20
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Earth science
C342S357490, C345S440000, C358S001100, C702S005000
Reexamination Certificate
active
11466306
ABSTRACT:
A method of coordinating surveys of different origins and which may be projected into different coordinate systems. The method provides a translation and rotation of the surveys to be coordinated without disturbing the internal geometry of each survey. A geographic information system including a procedure for coordinating surveys of different origins and/or which surveys which projected in different coordinate systems.
REFERENCES:
patent: 5140532 (1992-08-01), Beckwith et al.
patent: 5214757 (1993-05-01), Maurey et al.
patent: 5414462 (1995-05-01), Veatch
patent: 5614913 (1997-03-01), Nichols et al.
patent: 5774826 (1998-06-01), McBride
patent: 5986604 (1999-11-01), Nichols et al.
patent: 6047236 (2000-04-01), Hancock et al.
patent: 2005/0104884 (2005-05-01), Iwata et al.
Alfred Leich, GPS Satellite Surveying, 2nd. Edition, © 1995, Chpts. 12 and 14, pp. 451 to 475 and 486 to 499.
Francis H. Moffitt and Henry Bouchard, Surveying, 9th Edition, © 1992, Chpt. 11, pp. 431 to 499.
Raymond E. Davis, Francis S. Foote, James M. Anderson, Edward M. Mikhail, Surveying, Theory and Practice, 6th Edition, © 1981, Chpt. 14, pp. 564 to 613.
Wisconsin State Cartographer's Office, WLIA, Coordinate Systems Task Force Report, dated Jan. 2006, 2 pages.
Alan P. Vonderohe, WISCRS: Redesign of the WCCS, dated Mar. 2006, 97 pages.
Joseph H. Bell, Geographic Calculator 6.0 Software Review, The American Surveyor, Mar.-Apr. 2004, 3 pages.
Barlow John
Godfrey & Kahn S.C.
Le John
R.A. Smith National
Stewart Alan R.
LandOfFree
High accuracy survey grade GIS system does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with High accuracy survey grade GIS system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and High accuracy survey grade GIS system will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3907102