High accuracy inspection system and method for using same

Details High accuracy inspection system and method for using same High accuracy inspection system and method for using same

2006-10-03

2006-10-03

Knight, Anthony (Department: 2121)

Data processing: generic control systems or specific application

Generic control system, apparatus or process

Digital positioning

C700S057000, C700S058000, C700S062000, C700S118000, C700S182000, C702S150000, C702S152000

Reexamination Certificate

active

07117047

ABSTRACT:
A method and a system that enable the inspection of large envelopes and complex surfaces. This is accomplished by generating a rotation and translation transform which enables the process monitoring system to define the location of the product placed in a field of view of the process monitoring system, applying the transform to three dimensional CAD data defining the process being performed with respect to the product to provide transformed CAD data representative of three dimensional information in a two dimensional pattern of the process with respect to the process monitoring system, providing placement guidance signals at predetermined locations in relation to a region of the three dimensional product, and providing an inspection data gathering device having a handheld component and providing the predetermined locations.

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