Image analysis – Image transformation or preprocessing – Changing the image coordinates
Reexamination Certificate
2009-10-11
2011-11-15
Le, Brian (Department: 2624)
Image analysis
Image transformation or preprocessing
Changing the image coordinates
C382S295000
Reexamination Certificate
active
08059918
ABSTRACT:
An improved method of high accuracy beam placement for local area navigation in the field of semiconductor chip manufacturing. This invention demonstrates a method where high accuracy navigation to the site of interest within a relatively large local area (e.g. an area 200 μm×200 μm) is possible even where the stage
avigation system is not normally capable of such high accuracy navigation. The combination of large area, high-resolution scanning, digital zoom and registration of the image to an idealized coordinate system enables navigation around a local area without relying on stage movements. Once the image is acquired any sample or beam drift will not affect the alignment. Preferred embodiments thus allow accurate navigation to a site on a sample with sub-100 nm accuracy, even without a high-accuracy stage
avigation system.
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Carleson Peter D.
Rue Chad
Young Richard J.
FEI Company
Griner David
Le Brian
Scheinberg Michael O.
Scheinberg & Griner LLP
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