Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1994-01-28
1995-02-28
Turner, Samuel A.
Optics: measuring and testing
By particle light scattering
With photocell detection
356361, 356358, G01B 1102
Patent
active
053942400
ABSTRACT:
An air refractometer measures the refractive index of air by directing a laser beam onto a first nonlinear optical crystal to convert a part thereof into a second-harmonic wave, directs the laser beam and the second-harmonic wave onto a reflecting mirror which reflects them onto a second nonlinear optical crystal to convert another part of the laser beam into a second-harmonic wave, produces interference fringes by interference between the harmonic wave produced by the first nonlinear optical crystal and the harmonic wave produced by the second nonlinear optical crystal, counts the number of interference fringes generated when the reflecting mirror is moved, and divides the number of interference fringes by the distance moved by the reflecting mirror.
REFERENCES:
patent: 5116126 (1992-05-01), Wang et al.
patent: 5172186 (1992-12-01), Hosoe
patent: 5177566 (1993-01-01), Leuchs et al.
patent: 5337145 (1994-08-01), Chaney
Agency of Industrial Science & Technology
Ministry of International Trade & Industry
Turner Samuel A.
Wolfe Russell C.
LandOfFree
High-accuracy air refractometer utilizing two nonlinear optical does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with High-accuracy air refractometer utilizing two nonlinear optical , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and High-accuracy air refractometer utilizing two nonlinear optical will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-852111