Hierarchically managed boundary-scan testable module and method

Details Hierarchically managed boundary-scan testable module and method Hierarchically managed boundary-scan testable module and method

1995-11-13

1999-01-19

Beausoliel, Jr., Robert W.

Excavating

371 2231, G01R 3128

Patent

active

058621520

ABSTRACT:
A JTAG module (12) includes a master component (20) and any number of slave components (22). The master component (20) includes a TAP controller (24) and related control circuits. Through a control bus (35), the TAP controller (24) on the master component (20) controls boundary-scan registers (18) on the slave components (22). The boundary-scan registers (18) in the slave components (22) form a boundary-scan chain that originates and terminates at the master component (20). TAP controller circuitry may be omitted from the slave components (22). The boundary-scan registers (18) on the master and slave components (20, 22) are partitioned into external sections (26, 34) and internal sections (28, 36). The external sections couple to conductive traces (46) which are accessible from outside the module (12). The internal sections couple to conductive traces (48) which are substantially inaccessible from outside the module (12).

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