Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Circuit simulation
Reexamination Certificate
2011-08-23
2011-08-23
Rodriguez, Paul L (Department: 2123)
Data processing: structural design, modeling, simulation, and em
Simulating electronic device or electrical system
Circuit simulation
Reexamination Certificate
active
08005660
ABSTRACT:
An Integrated Circuit Design tool incorporating a Stochastic Analysis Process (“SAP”) is described. The SAP can be applied on many levels of circuit components including transistor devices, logic gate devices, and System-on-Chip or chip designs. The SAP replaces the large number of traditional Monte Carlo simulations with operations using a small number of sampling points or corners. The SAP is a hierarchical approach using a model fitting process to generate a model that can be used with any number of performance metrics to generate performance variation predictions along with corresponding statistical information (e.g., mean, three-sigma probability, etc.). A hierarchical SAP process breaks an overall circuit into a plurality of subcircuits and performs circuit simulation and SAP analysis steps on each subcircuit. An integration and reduction process combines the analysis results of each subcircuit, and a final SPICE/SAP process provides a model for the overall circuit based on the subcircuits.
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Chiu Hsien-Yen
Li Jun
Wang Meiling
Anova Solutions, Inc.
Dergosits & Noah LLP
Guill Russ
Rodriguez Paul L
Staniford Geoffery T.
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