Hierarchical link instruction register core/embedded core...

Details Hierarchical link instruction register core/embedded core... Hierarchical link instruction register core/embedded core...

2007-07-10

2007-07-10

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C714S733000, C714S734000

Reexamination Certificate

active

11096399

ABSTRACT:
A test architecture accesses IP core test wrappers within an IC using a Link Instruction Register (LIR). An IEEE P1500 standard is in development for providing test access to these individual cores via a test structure called a wrapper. The wrapper resides at the boundary of the core and provides a way to test the core and the interconnections between cores. The test architecture enables each of the plural wrappers in the IC, including wrappers in cores embedded within other cores, with separate enable signals.

REFERENCES:
patent: 4564943 (1986-01-01), Collins et al.
patent: 5285453 (1994-02-01), Gruodis
patent: 5381420 (1995-01-01), Henry
patent: 5889788 (1999-03-01), Pressly et al.

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