Heterolayered ferroelectric thin films and methods of...

Coating processes – Electrical product produced – Piezoelectric properties

Reexamination Certificate

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C427S126300, C427S240000, C427S376200, C427S380000, C427S419300

Reexamination Certificate

active

10738715

ABSTRACT:
Heterolayered thin films having ferroelectric/piezoelectric layers of alternating crystal structures and methods of their preparation are provided. In the ferroelectric/piezoelectric thin film, a first layer has a rhombohedral crystal structure and a second layer adjacent the first layer has a tetragonal crystal structure. The layers have a (100) preferred orientation with α-axis normal to the surface of the film. The first layer can be a Zr-rich lead ziroconate titanate layer (e.g., PbZr0.8Ti0.2O3) and the second layer can be a Ti-rich PZT layer (e.g., PbZr0.2Ti0.8O3). Heterolayered ferroelectric/piezoelectric thin film comprising a plurality of such first and second layers in alternating sequence exhibits particularly improved electrical properties.

REFERENCES:
patent: 4749900 (1988-06-01), Hadimioglu et al.
patent: 5913117 (1999-06-01), Lee
patent: 6440210 (2002-08-01), Bruchhaus et al.
patent: 2002/0127335 (2002-09-01), Lee et al.
patent: 2002/0185935 (2002-12-01), Yamamoto et al.
patent: 2003/0080329 (2003-05-01), Kurasawa et al.
patent: 1 308 990 (2003-07-01), None
patent: WO 90/12755 (1990-11-01), None
patent: WO 90/13149 (1990-11-01), None
patent: WO 01/67465 (2001-09-01), None
Applied Physics Letters, vol. 82(26), pp. 4761-4763, Large remanent polarization of 100% polar-axis-oriented epitaxial tetragonal Pb(Zr035Ti065)O3T thin films [L].
Q. Zou, H.E. Ruda and B.G. Yacobi, Applied Physics letters, 78, 2001. (p. 1282).
C.H. Lin, P.A. Friddle, C.H. Ma, A. Daga, and H. Chen, Journal of Applied Physics, 90, 2001, p. 1509.
T. Kumazama, Y. Kumagai, H. Miura, and M. Kitano, Applied Physics Letters, 72, 1998.
O. Lohse, M. Grossmann, U. Boettger, and D. Bolten, Journal of Applied Physics, 89, 2001.
Y. Sakashita, T. Ono, H. Segawa, K. Tominaga and M. Okada, Journal of Applied Physics, 69, 1991.
I. Kanno, S. Hayashi, R. Takayama and T. Hirao, Applied Physics Letters, 68, 1996.

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