Heterojunction bipolar transistor and method for...

Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device – Heterojunction formed between semiconductor materials which...

Reexamination Certificate

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C257S164000, C257S173000, C438S133000

Reexamination Certificate

active

11019270

ABSTRACT:
A heterojunction bipolar transistor with InGaP as the emitter layer and capable of both reliable electrical conduction and thermal stability wherein a GaAs layer is inserted between the InGaP emitter layer and AlGaAs ballast resistance layer, to prevent holes reverse-injected from the base layer from diffusing and reaching the AlGaAs ballast resistance layer.

REFERENCES:
patent: 6507089 (2003-01-01), Azuma et al.
patent: 6611008 (2003-08-01), Twynam et al.
patent: WO98/53502 (1998-11-01), None

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