Heterodyne michelson interferometer for polarization measurement

Details Heterodyne michelson interferometer for polarization measurement Heterodyne michelson interferometer for polarization measurement

1987-08-04

1989-05-23

McGraw, Vincent P.

Optics: measuring and testing

By particle light scattering

With photocell detection

356351, G01B 902

Patent

active

048324922

ABSTRACT:
The interferometer makes use of an acousto-optic device to perform a frequency shift of the beam sent along one of the interferometer branches, so as to allow the determination of the state of polarization by heterodyne radiofrequency detection. The acousto-optic device can be inserted downstream of the device for splitting the beam emitted by the source into the two beams sent along the two interferometer branches, or it can also act as the beam splitter.

REFERENCES:
patent: 4506388 (1985-03-01), Monerie et al.
patent: 4633715 (1987-01-01), Monchalin
R. Calvani et al, "A Heterodyne Mach-Zehnder Polarimeter for Real-Time Polarization Measurement", vol. 54, No. 2, 15 May 1985, pp. 63-67 (Optics Communications).
R. Calvani et al, "A Fast Heterodyne Interferometer for Real-Time Fibre Polarimetery", vol. XIII, No. 5, Oct. 1985 (CSET Technical reports), pp. 313-316.
H F Hazebrock et al, "Automated Laser Interferometric Ellipsometry and Precision Reflectometry", 8056 Journal of Physics E. Scientific Instruments, vol. 16 (1983), Jul., No. 7, Dorking, GB, pp. 654-661.
R. M. A. Azzam et al, "Ellipsometry and Polarized Light", North-Holland Pulishing Company-Amsterdam-New York-Oxford, 1977.

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