Optics: measuring and testing – By light interference – Having light beams of different frequencies
Reexamination Certificate
2008-02-29
2010-12-14
Lee, Hwa S. A (Department: 2886)
Optics: measuring and testing
By light interference
Having light beams of different frequencies
Reexamination Certificate
active
07852487
ABSTRACT:
A device for the optic measuring of an object (1), including a signal processing unit (2) as well as an interferometer with a light source (3) and with at least one detector (4a,4d). The interferometer is embodied such that a light beam (12) created by the light source (3) is split at least into a working beam (12a) and a reference beam (12b), with the working beam (12a) impinging the object (1) and the working beam (12a) is at least partially reflected by the object and interfered with the reference beam (12b) on the detector (4a,4b). The signal processing unit (2) is connected to the detector (4a,4b) and includes a vibrometer processing unit (2f), which detects the motion of the object (1) from the measuring signals of the detector (4a,4d). It is essential that the light source (3) creates light with a coherence length shorter than 1 cm and that the interferometer comprises a device for changing the optic path length (11), and the signal processing unit comprises a focus control (2d) controlling a device for changing the optic path length which controls the device for changing the optic path length such that the optic path length of the working beam and the reference beam are approximately adjusted to each other.
REFERENCES:
patent: 4818110 (1989-04-01), Davidson
patent: 6195168 (2001-02-01), De Lega et al.
patent: 6906806 (2005-06-01), Mermelstein
patent: 2008/0304075 (2008-12-01), Rembe
patent: 4108944 (1992-09-01), None
patent: 4404154 (1995-08-01), None
patent: 4429578 (1996-06-01), None
patent: 19721883 (1998-02-01), None
patent: 19733890 (1998-02-01), None
patent: 10047495 (2001-10-01), None
patent: 10131779 (2002-02-01), None
patent: 102005023212 (2006-11-01), None
Drabenstedt Alexander
Rembe Christian
Siegmund Georg
A Lee Hwa S.
Polytec GmbH
Volpe and Koenig P.C.
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